QTL mapping for leaf senescence-related traits in common wheat under limited and full irrigation

Leaf senescence is an important trait for yield improvement under stress

• From: Department for International Development
• Published: 1 January 2014

• Document Type: Journal Article
• Theme: Agriculture
• Authors: Trethowan, R., Chen XinMin, He ZhongHe, Li XingMao, Wang HuaJun, Xia XianChun, Xiao YongGui

Abstract

Leaf senescence is an important trait for yield improvement under stress. In the present study, 207 F2:4 random inbred lines (RILs) derived from the Jingdong 8/Aikang 58 cross were investigated under limited and full irrigation environments at two locations during the 2011–2012 and 2012–2013 cropping seasons.

Citation

Li XingMao; He ZhongHe; Xiao YongGui; Xia XianChun; Trethowan, R.; Wang HuaJun; Chen XinMin. QTL mapping for leaf senescence-related traits in common wheat under limited and full irrigation. Euphytica (2014) : [DOI: 10.1007/s10681-014-1272-4]

Links

QTL mapping for leaf senescence-related traits in common wheat under limited and full irrigation

Published 1 January 2014